Endeas Supplying Testing Solutions For HJT Fab

Apr 19,2019
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Finland headquartered testing solutions provider for the PV industry, Endeas Oy expects to complete delivery of its fully automated QuickSun all-in-one testing stations to a new heterojunction (HJT) PV module factory for final quality inspection in Q3/2019. The client is only identified as a leading non-Chinese PV manufacturer who needs these solutions that can provide an annual testing capacity of up to 750 MW. This means, it is likely REC, which is building a 600 MW HJT cell & module line in Singapore using the core equipment from Meyer Burger.

Endeas says its QuickSun systems enable accurate measurement of the maximum power and other I-V parameters of HJT modules thanks to the company’s in-house developed capacitance compensation (CAC) method, with a flash pulse of only 60 meters in length. The flash pulse allows the average lamp changeover interval to reach half a million measurements, making the cost of consumables negligible, stresses Endeas and adds that the QuickSun system also includes Xenon lamp technology.

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Applying a scientifically sound correction for the capacitive effects enables the industry to measure HJT and other high-efficiency technologies with uncompromised accuracy and reliability,” said Endeas’ Managing Director Jaakko Hyvärinen. “An additional advantage is that there is no need to compromise the lifetime of established Xenon tubes by applying unnecessarily long flash pulses. Neither is there need to apply LED technology, avoiding their fundamental deficiencies such as a non-continuous spectrum, instability problems with ultraviolet LEDs, and the risk of shipping a large number of modules measured with partially broken LED boards.”

The company first introduced the CAC method during EU PVSEC 2018 in Brussels as a method to measure steady-state IV curves in PV cells and modules.

Speaking of testing solutions, recently DuPont’s photovoltaic solutions business signed a collaboration agreement with Germany’s Fraunhofer ISE to validate and accelerate crystalline silicon solar panel sequential testing methods.